@article{2016,title={A RESEARCH ON THE ANALYSIS OF ACCELERATED LIFE TEST DATA},abstractNode={Accelerated Life Test (ALT) is the process of determining the reliability of product or systems in the phase of design. In ALT, under certain conditions, product or systems are subject to one or more stress levels. Applied stress types are usually temperature, pressure, humidity, voltage, radiation or with a combination of some of them. When the stress level under normal use conditions of the product or the system is usually accelerated, in a short time, problems arising from design are revealed. In this study, parameter of the ALT data of a company which produces 32” and upper LCD TV’s in Turkey, are estimated by Maximum Likelihood Estimation (MLE) method under assumption Arrhenius – Weibull model. By using estimated parameters, the lifetime of a product or system under normal use conditions and reliability in a desired time are obtained. As a result of the analysis, usefulness of these models and methods in practice are discussed.},author={Yasin BÜYÜKKÖR-- Cenk ÖZLER},year={2016},journal={The Journal of Academic Social Science}}